Small Methods (2023) 2300453 DOI:10.1002/smtd.202300453
Measuring spatially-resolved potential drops at semiconductor hetero-interfaces using 4D-STEM
V. Chejarla, S. Ahmed, J. Belz, J. Scheunert, A. Beyer, K. Volz
Small Methods
Measuring spatially-resolved potential drops at semiconductor hetero-interfaces using 4D-STEM
V. Chejarla, S. Ahmed, J. Belz, J. Scheunert, A. Beyer, K. Volz