ACS Nano (2025) DOI:10.1021/acsnano.4c15828

Reliability of the Transmission Line Method and Reproducibility of the Measured Contact Resistance of Organic Thin-Film Transistors

T. Wollandt, S. Steffens, Y. Radiev, F. Letzkus, J.N. Burghartz, G. Witte, H. Klauk

ACS Nano (2025) DOI:10.1021/acsnano.4c15828

List of all SFB 1083 publications.