ACS Nano (2025) DOI:10.1021/acsnano.4c15828
Reliability of the Transmission Line Method and Reproducibility of the Measured Contact Resistance of Organic Thin-Film Transistors
T. Wollandt, S. Steffens, Y. Radiev, F. Letzkus, J.N. Burghartz, G. Witte, H. Klauk