Small Methods (2023) 2300453 DOI:10.1002/smtd.202300453

Measuring spatially-resolved potential drops at semiconductor hetero-interfaces using 4D-STEM

V. Chejarla, S. Ahmed, J. Belz, J. Scheunert, A. Beyer, K. Volz

Small Methods (2023) 2300453 DOI:10.1002/smtd.202300453

List of all SFB 1083 publications.