Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM– Publication by A5 (Volz)
Andreas Beyer and coworkers achieved the determination and spatial resolution of electric fields at interfaces with the transmission electron microscope. Nanometer-scale built-in electric field are the basis of many modern (opto)electronic devices, such as solar cells, lasers or batteries. Optimization of these devices requires precise characterization of such fields at […]