ACS Nano (2025) DOI:10.1021/acsnano.4c15828

Reliability of the Transmission Line Method and Reproducibility of the Measured Contact Resistance of Organic Thin-Film Transistors

T. Wollandt, S. Steffens, Y. Radiev, F. Letzkus, J.N. Burghartz, G. Witte, H. Klauk

ACS Nano (2025) DOI:10.1021/acsnano.4c15828

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Phys. Rev. Lett. 134 (2025) 076902 DOI:10.1103/PhysRevLett.134.076902 — Editor’s Suggestion

Infrared Magnetopolaritons in MoTe2 Monolayers and Bilayers

B. Han, J.M. Fitzgerald, L. Lackner, R. Rosati, M. Esmann, F. Eilenberger, T. Taniguchi, K. Watanabe, M. Syperek, E. Malic, C. Schneider

Phys. Rev. Lett. 134 (2025) 076902 DOI:10.1103/PhysRevLett.134.076902 — Editor’s Suggestion

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Adv. Mater. Interfaces (2025) 2400573 DOI:10.1002/admi.202400573

Interface-Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface

G. Mette, K. Ishioka, S. Youngkin, W. Stolz, K. Volz, U. Höfer

Adv. Mater. Interfaces (2025) 2400573 DOI:10.1002/admi.202400573

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